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Fri 16 |
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09:00-09:30 |
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KEYNOTE |
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Title to be defined |
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Silke Christiansen,
Fraunhofer IKTS, Germany |
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09:30-09:45 |
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Oral contribution |
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09:45-10:00 |
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Oral contribution |
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10:00-10:15 |
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Oral contribution |
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10:15-10:35 |
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INVITED |
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Title to be defined |
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Arnaud Desmedt,
CNRS – Univ. Bordeaux, France |
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11:05-11:35 |
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INVITED |
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Raman spectroscopy and TERS applied to energy storage and conversion materials |
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Alejandro Morata Garcia,
IREC, Spain |
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11:35-11:50 |
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Oral contribution |
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11:50-12:05 |
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Oral contribution |
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12:05-12:25 |
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INVITED |
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Interfacial Instability in Operating Lithium-Ion Batteries Unraveled by SHINERS |
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Ivan T. Lucas ,
CNRS - Sorbonne Université, France |
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12:25-14:00 |
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Lunch Break - Posters session 1 |
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Advanced materials, Low-dimensional materials |
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14:00-14:45 |
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PLENARY |
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How to use Raman spectroscopy to study graphene and materials, and how to use them to take Raman spectra. |
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Andrea Ferrari,
University of Cambridge / CGC, UK |
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14:45-15:00 |
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Oral contribution |
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15:00-15:15 |
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Oral contribution |
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15:15-15:35 |
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INVITED |
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Hot photoluminescence and Raman processes in symmetric and asymmetric monolayer semiconductors |
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Ioannis Paradisanos,
INSA/CNRS Toulouse, France |
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15:35-15:50 |
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Oral contribution |
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15:50-16:10 |
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Oral contribution |
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16:10-17:00 |
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Coffee break - Posters session 2 |
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Semiconductors and Metrology |
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17:00-17:30 |
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KEYNOTE |
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Nanoscale materials characterization and metrology using Raman and PL |
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Thomas Nuytten,
IMEC, Belgium |
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17:30-17:45 |
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Oral contribution |
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17:45-17:55 |
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INVITED |
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Determination of free carrier concentration of polar semiconductors using LOPC modes: an example of InP |
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Van-Hoan Le,
CEA-LETI, France |
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17:55-18:10 |
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Oral contribution |
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18:10-18:25 |
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Oral contribution |
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